Characterization of epitaxial ZrO2by X-ray diffractometry with parallel-beam geometry
نویسندگان
چکیده
منابع مشابه
Parallel Beam Powder Diffractometry Using a Laboratory X-Ray Source
We report on the application of a new, non-dispersive double multilayer optical arrangement to prepare a parallel beam from a laboratory x-ray source for standardization of powder diffraction reference materials and the associated high accuracy diffractometer. The beam preparation optic uses a graded-spacing parabolic multilayer to gather radiation from a small focus x-ray source and a subseque...
متن کاملA Convergent Beam, Parallel Detection X-ray Diffraction System for Characterizing Combinatorial Epitaxial Thin Films
Multi-component epitaxial thin films have been studied extensively to produce new functional materials, such as superconductors and optical and magnetic devices. In order to optimize the material properties and obtain high-performance devices, we need to determine a large number of parameters, for example, the composition, structure of layers, superlattice periods and so on. Combinatorial synth...
متن کاملCharacterization and quantitation of clarithromycin polymorphs by powder X-ray diffractometry and solid-state NMR spectroscopy.
Characterization of clarithromycin polymorph was performed by solid-state cross polarization and magic angle spinning (CP/MAS) 13C-NMR spectroscopy. Two polymorphs, form II and form I, of clarithromycins indicated characteristic resonances of C1 carbonyl carbon at 176.2 and 175.2 ppm, respectively. Since each peak of C1 carbon was well separated in the spectrum of the two polymorphs, we perform...
متن کاملTHE DEVELOPMENT OF A MULTILAYER MIRROR SYSTEM USING CuKα AND CrKα RADIATION FOR USE IN MICRO BEAM X-RAY DIFFRACTOMETRY
A new optic system that produces a monochromatic microbeam for both CuKα and CrKα radiation for X-ray diffraction (XRD) has been developed. Multilayer optics technology is a well-known tool to produce a monochromatic micro X-ray beam for XRD. This new optic was combined with a microfocus rotating anode X-ray generator and a cylindrical imaging plate detector to provide a complete dual wavelengt...
متن کاملOptimization of x-ray imaging geometry (with specific application to flat-panel cone-beam computed tomography).
A theoretical method is presented that allows identification of optimal x-ray imaging geometry, considering the effects of x-ray source distribution, imaging task, x-ray scatter, and imager detective quantum efficiency (DQE). Each of these factors is incorporated into the ICRU-recommended figure of merit for image quality, the detectability index, which is maximized to determine the optimal sys...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1996
ISSN: 0108-7673
DOI: 10.1107/s0108767396085091